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Epson NS8080SH IC Test Handler

Product Models displayed on this website may be available in certain regions only.

Designed to Deliver Higher Performance and Throughput for All Your Testing Needs

High throughput to support the testing of smartphone, tablet PC and automotive chips even in the most extreme production environments.

    • Up to 8 sites testing capability
      Testing area from 184mm x 149mm
      Up to 120Kgf contact force
      UPH - up to 13,500 (ambient) & 
      Up to 8,200 (High Temperature)

Blazing Fast Speeds
Enjoy high-speed transfer, testing and sorting of chip packages of 13,500 chips per hour with a contact force of up to 240kgf.
 
Extreme High-temperature Support
Test chips at temperatures as high as 155°C and easily recover from jams during high-temperature use.
 
Support for Wide Socket Pitches
With a layout that accommodates even wide socket pitches, conveniently test large numbers of chips, including high-frequency (RF) chips.