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Epson NX1032XS IC Test Handler

Product Models displayed on this website may be available in certain regions only.

Engineered to Deliver the Most Reliable and Accurate Handler

Developed using leading-edge robot technology, this IC test handler boasts significantly improved performance to support even the most demanding tests.

    • Up to 32 site testing capability
      Testing area from 344mm x 244mm
      Up to 430kgf contact force
      UPH - up to 20,000 (Ambient) & 
      Up to 10,500 (High Temperature)

Simultaneous Multi-site Tests
Maximum throughput of up to 20,000 chips per hour with simultaneous multi-site tests for 32 IC devices and high contact force of up to 4,800N.
 
Test Hand-independent Heat Press Method
Test chips at temperatures as high as 155°C and reduce jam recovery time.
 
Convenient Compatibility
Compatible with a wide range of changeover kits for the existing NS series (including adapter compatible changeover kits).